Title
Femtosecond X-Ray Diffraction Of Short-Pulse Irradiated Semiconductors
Abstract
Femtosecond X-ray diffraction of short-pulse irradiated semiconductors was discussed. Ultrafast non-thermal solid-to-liquid transition in thin single-crystal Ge-111 films grown on Si-111 substrates were also studied. Proposed 4th generation light sources based upon single-pass x-ray free-electron lasers permitted single-shot structural determination of complex biomolecules.
Publication Date
1-1-2002
Publication Title
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
Number of Pages
297-298
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
0036457292 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0036457292
STARS Citation
Siders, Craig W.; Cavalleri, A.; and Tóth, Cs, "Femtosecond X-Ray Diffraction Of Short-Pulse Irradiated Semiconductors" (2002). Scopus Export 2000s. 2891.
https://stars.library.ucf.edu/scopus2000/2891