Title
Femtosecond X-Ray Diffraction Of Short-Pulse Irradiated Semiconductors
Abstract
Ultrafast optical-pump, x-ray diffraction probe experiments are providing new ways to study transient processes in physics, chemistry, and biology. In addition, the direct observation of the atomic motion by which many solid-state processes and chemical and biochemical reaction take place is included as well. As such, current table-top-terawatt femtosecond laser systems provide an attractive source of few-hundred femtosecond duration bursts of angstrom-scale x-ray radiation with fluxes comparable to standard rotating-anode sources.
Publication Date
1-1-2002
Publication Title
Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series
Volume
74
Number of Pages
113-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
0036373375 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/0036373375
STARS Citation
Siders, Craig W.; Cavalleri, A.; and Tóth, Cs, "Femtosecond X-Ray Diffraction Of Short-Pulse Irradiated Semiconductors" (2002). Scopus Export 2000s. 2944.
https://stars.library.ucf.edu/scopus2000/2944