Title

Hot Carrier And Soft Breakdown Effects On Vco Performance

Abstract

This paper systematically investigates the hot carrier and soft-breakdown induced performance degradation in a CMOS voltage-controlled oscillator used in phase locked loop frequency synthesizers. After deriving the closed-form equations to predict phase noise and VCO gain, we relate VCO RF performance such as phase noise, tuning range and gain of VCO subject to electrical stress. The circuit degradations predicted by analytical model equations are verified by SpectraRF simulation using parameters extracted from the experimental data of 0.16 μm CMOS technology.

Publication Date

1-1-2002

Publication Title

IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers

Number of Pages

459-462

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

0036309537 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0036309537

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