Title

Hot Carrier And Soft Breakdown Effects On Vco Performance

Abstract

This paper systematically investigates the hot carrier and soft-breakdown induced performance degradation in a CMOS voltage-controlled oscillator used in phase locked loop frequency synthesizers. After deriving the closed-form equations to predict phase noise and VCO gain, we relate VCO RF performance such as phase noise, tuning range and gain of VCO subject to electrical stress. The circuit degradations predicted by analytical model equations are verified by SpectraRF simulation using parameters extracted from the experimental data of 0.16 μm CMOS technology.

Publication Date

1-1-2002

Publication Title

IEEE MTT-S International Microwave Symposium Digest

Volume

1

Number of Pages

569-572

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

0036073145 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0036073145

This document is currently not available here.

Share

COinS