Title

Femtosecond Optical And X-Ray Measurement Of The Semiconductor-To-Metal Transition In Vo2

Abstract

Summary form only given. The dynamics of phase transformations in condensed phases have been intensely investigated for decades. While the use of ultrashort visible pulses has allowed measurement of ultrafast changes in the optical properties, the correlation between atomic movement and changes in the electronic properties of materials has proven more elusive. Ultrafast X-ray diffraction provides a direct way to retrieve lattice dynamics. Here, we report on the conjunct measurement of ultrafast electronic and structural dynamics during a semiconductor-to-metal phase transition in VO2, where rearrangement of the unit cell from monoclinic to rutile is accompanied by a sharp increase in the electrical conductivity.

Publication Date

1-1-2001

Publication Title

Technical Digest - Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, QELS 2001

Number of Pages

162-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/QELS.2001.962009

Socpus ID

84958250504 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84958250504

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