Title
Wavelength Selection For The Far-Infrared P-Ge Laser Using Etched Silicon Lamellar Gratings
Keywords
Germanium; Laser; Terahertz
Abstract
A lamellar mirror made from Si wafer by anisotropic chemical etching and coated with gold has been demonstrated as an intracavity wavelength selector for the far-infrared p-Ge laser. The etching process produces rectangular grooves with precisely predetermined depth and 100 nm surface smoothness. This lamellar-grating structure defines the resonant laser wavelength within the broad tuning range of the p-Ge laser. Single wavelength laser operation with this mirror has been demonstrated on the third-order resonance with an active cavity finesse of at least 0.09. © 2004 Elsevier Ltd. All rights reserved.
Publication Date
3-1-2005
Publication Title
Optics and Laser Technology
Volume
37
Issue
2
Number of Pages
87-91
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.optlastec.2004.02.011
Copyright Status
Unknown
Socpus ID
5444255091 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/5444255091
STARS Citation
Du Bosq, T. W.; Peale, R. E.; and Nelson, E. W., "Wavelength Selection For The Far-Infrared P-Ge Laser Using Etched Silicon Lamellar Gratings" (2005). Scopus Export 2000s. 4065.
https://stars.library.ucf.edu/scopus2000/4065