Title
Reliable Super Resolution Beam Profiler For Lasers In Manufacturing
Abstract
Demonstrated is a first of a kind hybrid analog-digital laser beam profiler based on a Digital Micro-Mirror Device. Tests at 1550 nm show a 2 micron profiling resolution over a 600 micron side square zone. © 2004 Optical Society of America.
Publication Date
1-1-2005
Publication Title
Optics InfoBase Conference Papers
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
84899142582 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84899142582
STARS Citation
Riza, Nabeel A. and Ghauri, Farzan N., "Reliable Super Resolution Beam Profiler For Lasers In Manufacturing" (2005). Scopus Export 2000s. 4284.
https://stars.library.ucf.edu/scopus2000/4284
COinS