Title

Voltage Stress-Induced Performance Degradation In Nmosfet Mixer

Keywords

CMOS integrated circuits; gain; hot carrier; linearity; noise; stress

Abstract

This paper presents an insight into the performance degradation in Gilbert mixer due to the voltage stress-induced hot carrier effects. Analytical analysis relates the performance degradation with the model parameter shifts caused by voltage stress. The stressinduced parameter shifts are examined experimentally. Performance degradation in mixer is investigated through Spectre-RF simulation with the models extracted from measured data. © 2005, The Institute of Electronics, Information and Communication Engineers. All rights reserved.

Publication Date

1-1-2005

Publication Title

IEICE Electronics Express

Volume

2

Issue

5

Number of Pages

133-137

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1587/elex.2.133

Socpus ID

77953130542 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/77953130542

This document is currently not available here.

Share

COinS