Title
Laser Plasma Euvl Sources - Progress And Challenges
Abstract
The most pressing technical issue for the success of EUV lithography is the provision of a high repetition-rate source having sufficient brightness, lifetime, and with sufficiently low off-band heating and particulate emissions characteristics to be technically and economically viable. We review current laser plasma approaches and achievements, with the objective of projecting future progress and identifying possible limitations and issues requiring further investigation.
Publication Date
8-18-2004
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Volume
5374
Issue
PART 1
Number of Pages
447-453
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1117/12.541586
Copyright Status
Unknown
Socpus ID
3843051243 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/3843051243
STARS Citation
Richardson, M.; Koay, C. S.; Takenoshita, K.; Keyser, C.; and George, S., "Laser Plasma Euvl Sources - Progress And Challenges" (2004). Scopus Export 2000s. 5423.
https://stars.library.ucf.edu/scopus2000/5423