Title
Soft Breakdown Effects On Mos Switch And Passive Mixer
Keywords
MOS switch; Passive mixer; Soft breakdown
Abstract
On wafer 0.16 μm NMOS transistors are stressed and measured. Soft breakdown effects on MOS switch and passive mixer are evaluated. Time constant for the switch increases. Conversion gain and LO feed-through of the mixer degraded.
Publication Date
7-12-2004
Publication Title
Annual Proceedings - Reliability Physics (Symposium)
Number of Pages
653-654
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
3042518739 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/3042518739
STARS Citation
Sadat, Anwar; Liu, Yi; Yuan, Jiann; and Xie, Huikai, "Soft Breakdown Effects On Mos Switch And Passive Mixer" (2004). Scopus Export 2000s. 5436.
https://stars.library.ucf.edu/scopus2000/5436
COinS