Title
Soft Breakdown Effects On Mos Switch And Passive Mixer
Keywords
MOS switch; Passive mixer; Soft breakdown
Abstract
On wafer 0.16 μm NMOS transistors are stressed and measured. Soft breakdown effects on MOS switch and passive mixer are evaluated. Time constant for the switch increases. Conversion gain and LO feed-through of the mixer degraded.
Publication Date
1-1-2004
Publication Title
IEEE International Reliability Physics Symposium Proceedings
Volume
2004-January
Issue
January
Number of Pages
653-654
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/RELPHY.2004.1315435
Copyright Status
Unknown
Socpus ID
84932124224 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84932124224
STARS Citation
Sadat, Anwar; Liu, Yi; Yuan, Jiann; and Xie, Huikai, "Soft Breakdown Effects On Mos Switch And Passive Mixer" (2004). Scopus Export 2000s. 5493.
https://stars.library.ucf.edu/scopus2000/5493