Title
Phase Characterization Of Reflectarray Elements At Infrared
Keywords
Infrared; Microstrip reflectarray
Abstract
The feasibility of a square-patch reflectarray element design is demonstrated at a frequency of 28.3 THz in the infrared (10.6 micrometer free-space wavelength) for the first time. Fabrication of arrays of various patch sizes was performed using electron-beam lithography, and the reflected phase as a function of patch size was characterized using an infrared interferometer. A numerical model for the design of these reflectarray elements was developed incorporating measured values of frequency-dependent material properties, and a comparison of computed and measured phase shows close agreement. © 2007 IEEE.
Publication Date
11-1-2007
Publication Title
IEEE Transactions on Antennas and Propagation
Volume
55
Issue
11 I
Number of Pages
2989-2993
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/TAP.2007.908537
Copyright Status
Unknown
Socpus ID
36849007440 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/36849007440
STARS Citation
Ginn, James C.; Lail, Brian A.; and Boreman, Glenn D., "Phase Characterization Of Reflectarray Elements At Infrared" (2007). Scopus Export 2000s. 5897.
https://stars.library.ucf.edu/scopus2000/5897