Title
Characterizing Infrared Frequency Selective Surfaces On Dispersive Media
Keywords
Frequency selective surfaces; Nanoscale device modeling
Abstract
With the emergence of frequency selective surfaces (FSS) and other passive planar antenna devices at infrared frequencies, the increasing need for accurate characterization using numerical modeling prior to device fabrication has exposed limitations in the traditional modeling procedures used for lower frequency FSS designs. To improve fulll-wave FSS models at IR, a procedure to measure and integrate dispersive material properties in modeling is described. Measured and modeled results are provided as verification demonstrating the need to account for material dispersion in infrared FSS design. © 2007 ACES.
Publication Date
3-1-2007
Publication Title
Applied Computational Electromagnetics Society Journal
Volume
22
Issue
1
Number of Pages
184-188
Document Type
Article
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
33947379616 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/33947379616
STARS Citation
Ginn, James; Lail, Brian; Shelton, David; Tharp, Jeffrey; and Folks, William, "Characterizing Infrared Frequency Selective Surfaces On Dispersive Media" (2007). Scopus Export 2000s. 6869.
https://stars.library.ucf.edu/scopus2000/6869