Title
A Novel And Powerful Tcad Methodology To Evaluate Performance Of Esd Protection Devices
Keywords
CDM; ESD; Evaluation; Simulation; TCAD
Abstract
On-chip electrostatic discharge (ESD) protection requires not only extensive technical experience but also scientific technology computer aided design (TCAD) methodology for evaluation. A novel and powerful TCAD methodology aimed to evaluate performance of ESD protection devices objectively is developed and presented. Mix-mode transient circuit simulation, which depicts ESD events better, is acquired in this simulation method. This TCAD methodology pays more attentions to the transient behaviors and characteristics of ESD protection devices which are more valuable to predict performance of ESD protection devices. This TCAD methodology with good ability of convergence can evaluate the performance of ESD protection devices scientificly and has strong direction ability to the design of ESD protection devices.
Publication Date
12-1-2007
Publication Title
IET Conference Publications
Issue
529 CP
Number of Pages
16-23
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1049/cp:20070677
Copyright Status
Unknown
Socpus ID
67650119458 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/67650119458
STARS Citation
Yan, Han; Ma, Shaoyu; Qiang, Cui; Liou, J. J.; and Dong, Shurong, "A Novel And Powerful Tcad Methodology To Evaluate Performance Of Esd Protection Devices" (2007). Scopus Export 2000s. 6021.
https://stars.library.ucf.edu/scopus2000/6021