Title

Method For Determining A Transmission Line Pulse Shape That Produces Equivalent Results To Human Body Model Testing Methods

Abstract

Electrostatic discharge (ESD) is responsible for more than 25% of semiconductor device and chip damage each year. This paper focuses on an ESD event resulting from the charge being transferred from a human body to an integrated circuit (i.e., called the human body model, HBM). In particular, the study provides simulation and experimental results to determine the main mechanism governing the failure of MOS devices subjected to the HBM stress. Based on this mechanism, the correct pulse needed to measure the HBM ESD characteristics using the transmission line pulse (TLP) technique is also determined and recommended.

Publication Date

12-1-2000

Publication Title

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Number of Pages

97-104

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

0034538867 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/0034538867

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