Title

Expediting Ga-Based Evolution Using Group Testing Techniques For Reconfigurable Hardware

Abstract

Autonomous repair and refurbishment of reprogrammable logic devices using Genetic Algorithms can improve the fault tolerance of remote mission-critical systems. The goal of increasing availability by minimizing the repair time is addressed in this paper using a CGT-pruned Genetic Algorithm. The proposed method utilizes resource performance information obtained using Combinatorial Group Testing (CGT) techniques to evolve refurbished configurations in fewer generations than conventional genetic algorithms. A 3-bit x 2-bit Multiplier circuit was evolved using both conventional and CGT-pruned genetic algorithms. Results show that the new approach yields completely refurbished configurations 37.6% faster than conventional genetic algorithms. In addition it is demonstrated that for the same circuit, refurbishment of partially-functional configurations is a more tractable problem than designing the configurations when using genetic algorithms as results show the former to take 80% fewer generations. © 2006 IEEE.

Publication Date

12-1-2006

Publication Title

Proceedings of the 2006 IEEE International Conference on Reconfigurable Computing and FPGA's, ReConFig 2006

Number of Pages

106-113

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/RECONF.2006.307760

Socpus ID

46449103069 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/46449103069

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