Title
Design And Integration Of Robust Esd Protection In Cmos/Bicmos Technologies
Keywords
Electrostatic discharge; High-Holding; Holding voltage; Latchup; Low-Voltage-Trigger Silicon Controlled Rectifier (HH-LVTSCR); Voltage snapback
Abstract
Robust and novel devices called High Holding, Low-Voltage-Trigger Silicon Controlled Rectifiers (HH-LVTSCRs) for Electrostatic Discharge (ESD) protection of integrated circuits (ICs) are designed, fabricated and characterized. The S-type current-voltage (I-V) characteristics of the HH-LVTSCRs are adjustable to different operating conditions by changing the device dimensions and terminal interconnections. Experimental results demonstrate that HH-LVTSCRs with a multiple-finger layout render high levels of ESD protection per unit area, applicable in the design of ICs with stringent ESD protection requirements of over 15 kV IEC.
Publication Date
9-29-2006
Publication Title
Proceedings - Electrochemical Society
Volume
PV 2006-03
Number of Pages
208-214
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
33748979924 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/33748979924
STARS Citation
Liou, Juin J., "Design And Integration Of Robust Esd Protection In Cmos/Bicmos Technologies" (2006). Scopus Export 2000s. 8176.
https://stars.library.ucf.edu/scopus2000/8176