Title
A New Model For Four-Terminal Junction Field-Effect Transistors
Keywords
Analog circuit; Compact modeling; Field effect transistors
Abstract
This paper presents a compact and semi-empirical model for a four-terminal (independent top and bottom gates) junction field-effect transistor (JFET). The model describes the steady-state characteristics for all bias conditions with a unified equation. Moreover, the model provides a high degree of accuracy and continuity for the different operation regions, a critical factor for robust analog circuit simulations. Capacitance modeling is also included to describe the JFET small-signal behavior. The model has been implemented in Cadence framework via Verilog-A and compared with data measured from JFETs used at Texas Instruments. © 2006 Elsevier Ltd. All rights reserved.
Publication Date
3-1-2006
Publication Title
Solid-State Electronics
Volume
50
Issue
3
Number of Pages
422-428
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.sse.2006.01.001
Copyright Status
Unknown
Socpus ID
33646095768 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/33646095768
STARS Citation
Ding, Hao; Liou, Juin J.; Green, Keith; and Cirba, Claude R., "A New Model For Four-Terminal Junction Field-Effect Transistors" (2006). Scopus Export 2000s. 8498.
https://stars.library.ucf.edu/scopus2000/8498