Title
Air-Pressure Effect On Room Temperature Hydrogen Sensitivity Of Semiconductor Tin Oxide-Based Thin Film Micro-Sensor
Abstract
Nanocrystalline indium oxide (In 2O 3)-doped tin oxide (SnO 2) thin film sensor has been sol-gel dip-coated on a microelectrochemical system (MEMS) device. Hydrogen (H 2) at ppm-level has been successfully detected at room temperature using the present MEMS-based sensor. The room temperature H 2 sensitivity of the present MEMS-based sensor has been investigated as a function of air-pressure (50-600 Torr) with and without the ultraviolet (UV) radiation exposure. It has been demonstrated that, the concentration of the surface-adsorbed oxygen-ions (which is related to the sensor-resistance in air), the ppm-level H 2, and the oxygen (O 2) partial pressure are the three major factors, which determine the variation in the room temperature H 2 sensitivity of the present micro-sensor as a function of air-pressure. Copyright © 2006 ASM International®.
Publication Date
5-1-2006
Publication Title
Surface Engineering - Proceedings of the 4th International Surface Engineering Conference
Volume
2005
Number of Pages
207-213
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
33646000276 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/33646000276
STARS Citation
Shukla, Satyajit; Drake, Christina; Cho, Hyoung J.; Seal, Sudipta; and Ludwig, Lawrence, "Air-Pressure Effect On Room Temperature Hydrogen Sensitivity Of Semiconductor Tin Oxide-Based Thin Film Micro-Sensor" (2006). Scopus Export 2000s. 8651.
https://stars.library.ucf.edu/scopus2000/8651