Title

Nonlinear Lens Mapping Of Optical Substrates

Abstract

We have tested a technique for characterizing optical substrates using high sensitivity of the constant of nonlinear refraction to the structural and compositional homogeneity of the material. The technique consists in two steps: first the substrate is positioned in the focal region of a lens where the signal of the nonlinear phase shift is maximal and, second, the substrate is scanned in directions transverse to the propagation direction of the probe laser beam. The measured variations are proportional to variations in the nonlinear phase shift across the substrate and reflect distribution of parameters that contribute into the nonlinear phase shift, including the absorption coefficient and substrate thickness. This technique can be used for mapping trace amounts of impurities, dopants and inclusions as well as varying external/boundary conditions in glass substrates, liquid crystals, and other materials. As an example, we have visualized subtle changes inflicted on a holographic glass by UV exposure.

Publication Date

5-1-2006

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

6101

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.646567

Socpus ID

33645991554 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/33645991554

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