Title
Relative Intensity Noise Characteristics In A Frequency Stabilized Modelocked Semiconductor Laser System
Abstract
RIN characteristics in a frequency stabilized MSL were experimentally and theoretically investigated. Average RIN level of less than -150dB/Hz as well as Modal RIN reduction of approximately 3dB were obtained from the frequency stabilized MSL. © 2005 Optical Society of America.
Publication Date
1-1-2006
Publication Title
Optics InfoBase Conference Papers
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
84899138819 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84899138819
STARS Citation
Lee, Wangkuen; Choi, Myoung taek; Izadpanah, Hossein; and Delfyett, Peter J., "Relative Intensity Noise Characteristics In A Frequency Stabilized Modelocked Semiconductor Laser System" (2006). Scopus Export 2000s. 8974.
https://stars.library.ucf.edu/scopus2000/8974