Title

Evaluating Optical Contact Bonds Using Thin-Film Zno Transducers

Abstract

The bond integrity between optically bonded fused quartz blocks has been evaluated using ultrasonic waves in the frequency range from 200 MHz to 800 MHz. The ultrasonic waves were produced by thin-film zinc oxide (ZnO) transducers. By excitation of the thin film ZnO transducers on glass blocks of two different thicknesses and optically bonding their free surfaces opposite the transducers, the properties of the bonded area can be evaluated using transmission and reflection loss measurements. The measurements were made using pulse excitation and detection, and spectrum analyzer measurements. © 2006 IEEE.

Publication Date

1-1-2006

Publication Title

Proceedings of the IEEE International Frequency Control Symposium and Exposition

Number of Pages

338-342

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/FREQ.2006.275409

Socpus ID

39049156012 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/39049156012

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