Title

Complex Refractive Indices Of Cd X Zn 1-X O Thin Films Grown By Molecular Beam Epitaxy

Keywords

Cadmium zinc oxide; Ellipsometry; Optical constants; Refractive index; Spectrophotometry; Wide-bandgap semiconductors

Abstract

The complex refractive indices of Cd x Zn 1-x O thin films were determined by transmission spectrophotometry. Transmission spectra were modeled from 375 nm to 800 nm for samples having cadmium concentrations ranging from 2% to 77%. The transparent and absorptive regimes were fitted separately by Sellmeier and Forouhi-Bloomer models, respectively. Real refractive indices of Cd x Zn 1-x O shift to higher values in the transparent region and the optical absorption edge shifts to longer wavelengths with increasing cadmium concentration. Spectroscopic ellipsometry was carried out on one sample from λ = 190 nm to 1.8 μm. Comparison between the two methods shows that the results are in general agreement. © 2008 TMS.

Publication Date

11-1-2008

Publication Title

Journal of Electronic Materials

Volume

37

Issue

11

Number of Pages

1665-1673

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1007/s11664-008-0527-z

Socpus ID

53149093177 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/53149093177

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