Title

Reflectivity Of A Glass Thin Film With Different Nanostructures

Keywords

DDA; Nanostructure; Reflectivity; Semi-ellipsoid; Thin film

Abstract

We investigate the reflectivity of glass thin films with different nanostructures using electromagnetic theory. The Discrete Dipole Approximation (DDA) method is used in the calculations. The thickness of the film is varied from 50 to 200 nm. Films composed of semi-ellipsoid, cylinder, and prism particle arrays are examined in order to understand the structure dependence of the thin film reflectivity at nanoscale level. When the film thickness is 50 nm, films with effective dielectric constant gradient exhibit lower reflectivity than those with the uniform dielectric constant. At short wavelengths, the thin film nanostructure has a significant influence to its reflectivity. For longer ones, especially when the wavelength is much larger than the film thickness, the effect of the nanostructure becomes less important and the volume of the film evolves to be an important factor. We also explore the reflectivity of glass films including a 100 nm thick solid substrate layer and nanostructures of different heights. For a film with semi-ellipsoid arrays of the same thickness, its reflectivity drops with the increase of the semi-ellipsoid diameter. The simulation results can be of help in the design of thin film solar cell coating for the enhancement of solar energy conversion efficiency.

Publication Date

11-21-2008

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

7033

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.793264

Socpus ID

56249141137 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/56249141137

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