Title
Corrigendum To "Nanoindentation Measurements Of The Mechanical Properties Of Polycrystalline Au And Ag Thin Films On Silicon Substrates: Effects Of Grain Size And Film Thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (Doi:10.1016/J.Msea.2006.04.080)
Publication Date
10-25-2008
Publication Title
Materials Science and Engineering A
Volume
494
Issue
1-2
Number of Pages
466-
Document Type
Correction
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.msea.2008.06.002
Copyright Status
Unknown
Socpus ID
49849089453 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/49849089453
STARS Citation
Cao, Yifang; Allameh, Seyed; Nankivil, Derek; Sathiaraj, T. Stephen; and Otiti, Tom, "Corrigendum To "Nanoindentation Measurements Of The Mechanical Properties Of Polycrystalline Au And Ag Thin Films On Silicon Substrates: Effects Of Grain Size And Film Thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (Doi:10.1016/J.Msea.2006.04.080)" (2008). Scopus Export 2000s. 9783.
https://stars.library.ucf.edu/scopus2000/9783