Title

Quantitative Infrared Imaging Of Silicon-On-Insulator Microring Resonators

Abstract

There is considerable research activity in multiresonator optical circuits in silicon photonics, e.g., for higher-order filters, advanced modulation format coding/decoding, or coupled-resonator optical waveguide delay lines. In diagnostics of such structures, it is usually not possible to measure each individual microring resonator without adding separate input and output waveguides to each resonator. We demonstrate a non-invasive diagnostic method of quantitative IR imaging, applied here to a series cascade of rings. The IR images contain information on the otherwise inaccessible individual through ports and the resonators themselves, providing an efficient means to obtain coupling, loss, and intensity-enhancement parameters for the individual rings. © 2010 Optical Society of America.

Publication Date

3-1-2010

Publication Title

Optics Letters

Volume

35

Issue

5

Number of Pages

784-786

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/OL.35.000784

Socpus ID

77649212794 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/77649212794

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