Title

Integration-Based Approach To Evaluate The Sub-Threshold Slope Of Mosfets

Abstract

We propose the use of simple integration-based methods to extract the sub-threshold current slope factor of MOSFETs as an alternative to traditional extraction processes based on differentiating the sub-threshold transfer characteristics. The purpose is to lessen the effects of error and noise often present in the measurement of very small currents, which are aggravated by the differentiation processes. The effectiveness of the proposed methods is compared to the traditional Transconductance-to-Current Ratio method using the measured transfer characteristics of two experimental devices as application examples. © 2009 Elsevier Ltd. All rights reserved.

Publication Date

2-1-2010

Publication Title

Microelectronics Reliability

Volume

50

Issue

2

Number of Pages

312-315

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1016/j.microrel.2009.11.001

Socpus ID

74449092106 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/74449092106

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