Title

A New Esd Design Methodology For High Voltage Dmos Applications

Abstract

A comprehensive methodology for synthesizing robust ESD performance in highly sensitive high voltage NLDMOS functional blocks is introduced. Optimizing high voltage output stage design for robust device- and system-level (IEC 61000-4-2)/HMM is assessed under 1-, 2-, 5-, 10- ,100-ns wide time frames of typical electrostatic discharge (ESD) stress models.

Publication Date

12-24-2010

Publication Title

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

78650378269 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/78650378269

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