Title

Investigation Of Waffle Structure Scr For Electro-Static Discharge (Esd) Protection

Keywords

Electro-static discharge (ESD); ESD Robustness; Silicon-controlled rectifier (SCR); Symmetrical layout

Abstract

The waffle layout SCR-based ESD protection device is presented and analyzed in this paper. This waffle structure with symmetrical layout is designed to generate more current paths to distribute ESD currents better. TLP I-V measurement results show that, the stand-alone waffle layout SCR costs only 39 percent silicon area of conventional stripe layout SCR, but can achieve better ESD robustness. Results also show that the trigger voltage and current handling ability of waffle layout SCR can be adjustable to meet different operating demands by changing the device dimensions. © 2012 IEEE.

Publication Date

12-1-2012

Publication Title

2012 IEEE International Conference on Electron Devices and Solid State Circuit, EDSSC 2012

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/EDSSC.2012.6482791

Socpus ID

84875758655 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84875758655

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