Title
A Novel Electrostatic Discharge (Esd) Protection Circuit In D-Mode Phemt Technology
Keywords
D-Mode; ESD; HBM; HEMT
Abstract
Electrostatic discharge (ESD) protection structures in the D-Mode GaAs HEMT technology are commonly constructed using either stacked Schottky diode or Single-Gate clamp. This paper develops an improved ESD protection clamp based on a novel multi-gate pHEMT in D-Mode technology. With similar layout area, the proposed ESD protection clamp can carry much higher current than the conventional single-gate pHEMT clamp under the human body model (HBM) stress. © 2012 IEEE.
Publication Date
12-20-2012
Publication Title
Technical Digest - IEEE Compound Semiconductor Integrated Circuit Symposium, CSIC
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/CSICS.2012.6340079
Copyright Status
Unknown
Socpus ID
84871146967 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84871146967
STARS Citation
Cui, Qiang; Zhang, Shuyun; Zhao, Yibing; Hou, Bin; and Liou, Juin J., "A Novel Electrostatic Discharge (Esd) Protection Circuit In D-Mode Phemt Technology" (2012). Scopus Export 2010-2014. 4193.
https://stars.library.ucf.edu/scopus2010/4193