Title

Experimental Verification Of Rf Stress Effect On Cascode Class-E Pa Performance And Reliability

Keywords

Cascode class E; gate oxide breakdown; output power; power amplifier (PA); power efficiency; reliability

Abstract

A cascode class-E power amplifier (PA) operating at 5.2 GHz has been designed using Advanced Design System simulation. RF circuit performances such as output power and power-added efficiency before and after RF stress have been experimentally investigated. The measured output power, power-added efficiency, and linearity after high-input-power RF stress at elevated supply voltage show significant circuit degradations. The impact of hot-carrier injection and gate oxide soft breakdown on cascode class-E PA reliability is discussed. © 2012 IEEE.

Publication Date

6-14-2012

Publication Title

IEEE Transactions on Device and Materials Reliability

Volume

12

Issue

2

Number of Pages

369-375

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/TDMR.2011.2179548

Socpus ID

84862013926 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84862013926

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