Title
Rf Stress Effects On Cmos Lc-Loaded Vco Reliability Evaluated By Experiments
Abstract
A current reused LC voltage-controlled oscillator (VCO) operating at 2.4 GHz range has been designed and fabricated. The measured output current, phase noise, and oscillation frequency after RF stress show significant parameter shifts from their fresh circuit condition. Impact of hot carrier effect and negative bias temperature instability on the VCO's phase noise is discussed. © 2012 Elsevier Ltd. All rights reserved.
Publication Date
11-1-2012
Publication Title
Microelectronics Reliability
Volume
52
Issue
11
Number of Pages
2655-2659
Document Type
Article
Personal Identifier
scopus
DOI Link
https://doi.org/10.1016/j.microrel.2012.04.007
Copyright Status
Unknown
Socpus ID
84867578994 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84867578994
STARS Citation
Yen, H. D.; Yuan, J. S.; Wang, R. L.; Huang, G. W.; and Yeh, W. K., "Rf Stress Effects On Cmos Lc-Loaded Vco Reliability Evaluated By Experiments" (2012). Scopus Export 2010-2014. 4732.
https://stars.library.ucf.edu/scopus2010/4732