Title

Numerical Modeling Of Scattering Type Scanning Near-Field Optical Microscopy

Keywords

infrared antenna; numerical modeling; Scanning Near-Field Optical Microscopy

Abstract

Apertureless scattering-type Scanning Near-field Optical Microscopy (s-SNOM) has been used to study the electromagnetic response of infrared antennas below the diffraction limit. The ability to simultaneously resolve the phase and amplitude of the evanescent field relies on the implementation of several experimentally established background suppression techniques. We model the interaction of the probe with a patch antenna using the Finite Element Method (FEM). Green's theorem is used to predict the far-field, cross-polarized scattering and to construct the homodyne amplified signal. This approach allows study of important experimental phenomena, specifically the effects of the reference strength, demodulation harmonic, and detector location. © 2013 Copyright SPIE.

Publication Date

12-1-2013

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

8815

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.2023513

Socpus ID

84896824448 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84896824448

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