Title
Dual-Comb Metrology For Semiconductor Optical Frequency Comb Characterization
Abstract
Spectrally efficient dual-comb detection is utilized for self-referenced measurements of spectral phase of three distinct semiconductor frequency combs. The higher-order phase is quantified for each, elucidating the dispersive properties of the gain and fiberized cavities. © OSA 2013.
Publication Date
11-18-2013
Publication Title
CLEO: Science and Innovations, CLEO_SI 2013
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
84887459723 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84887459723
STARS Citation
Klee, Anthony; Davila-Rodriguez, Josue; Williams, Charles; and Delfyett, Peter J., "Dual-Comb Metrology For Semiconductor Optical Frequency Comb Characterization" (2013). Scopus Export 2010-2014. 6493.
https://stars.library.ucf.edu/scopus2010/6493