Title
Dual-Comb Metrology For Semiconductor Optical Frequency Comb Characterization
Abstract
Spectrally efficient dual-comb detection is utilized for self-referenced measurements of spectral phase of three distinct semiconductor frequency combs. The higher-order phase is quantified for each, elucidating the dispersive properties of the gain and fiberized cavities. © 2013 The Optical Society.
Publication Date
1-1-2013
Publication Title
2013 Conference on Lasers and Electro-Optics, CLEO 2013
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/cleo_si.2013.ctu2i.2
Copyright Status
Unknown
Socpus ID
84903764281 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84903764281
STARS Citation
Klee, Anthony; Davila-Rodriguez, Josue; Williams, Charles; and Delfyett, Peter J., "Dual-Comb Metrology For Semiconductor Optical Frequency Comb Characterization" (2013). Scopus Export 2010-2014. 7552.
https://stars.library.ucf.edu/scopus2010/7552