Title

Broadband Near-Field Detection With Multi-Frequency Probe Microscopy

Abstract

Using scanning probe microscopy with modulated illumination, we demonstrate simultaneous measurement of topography and optical forces exerted on a probe. Broadband optical field detection is possible using a single probe. © OSA 2013.

Publication Date

11-21-2013

Publication Title

CLEO: QELS_Fundamental Science, CLEO:QELS FS 2013

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

84887671073 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84887671073

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