Title

Broadband Near-Field Detection With Multi-Frequency Probe Microscopy

Abstract

Using scanning probe microscopy with modulated illumination, we demonstrate simultaneous measurement of topography and optical forces exerted on a probe. Broadband optical field detection is possible using a single probe. © 2013 The Optical Society.

Publication Date

1-1-2013

Publication Title

2013 Conference on Lasers and Electro-Optics, CLEO 2013

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/cleo_qels.2013.qm1b.5

Socpus ID

84903772995 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84903772995

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