Title
Complementarity Of Intensity And Optical Force Measurements In Scanning Probe Microscopy
Abstract
We demonstrate that intensity and optical force gradient maps provide complementary measures of the near-field light distribution in scanning probe microscopy (SPM). Sensitivity of metal coated SPM probes to magnetic fields is shown. © OSA 2013.
Publication Date
1-1-2013
Publication Title
Optics InfoBase Conference Papers
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/ls.2013.lth3g.5
Copyright Status
Unknown
Socpus ID
85087595912 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85087595912
STARS Citation
Kohlgraf-Owens, D. C.; Sukhov, S.; and Dogariu, A., "Complementarity Of Intensity And Optical Force Measurements In Scanning Probe Microscopy" (2013). Scopus Export 2010-2014. 7446.
https://stars.library.ucf.edu/scopus2010/7446