Title
Nonlinear Characterization Of Thin Films By The Dual-Arm Z-Scan Method
Abstract
We report nonlinear refraction and absorption of organic (polymethine) and semiconductor (ZnO) thin films on thick substrates using the dual-arm Z-scan method to remove the substrate signals, thus allowing the discrimination of very small signals. © OSA 2013.
Publication Date
1-1-2013
Publication Title
Optics InfoBase Conference Papers
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/fio.2013.fw1a.7
Copyright Status
Unknown
Socpus ID
85085776824 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85085776824
STARS Citation
Ensley, Trenton R.; Hu, Honghua; Hales, Joel M.; Kim, Hyeongeu; and Perry, Joseph W., "Nonlinear Characterization Of Thin Films By The Dual-Arm Z-Scan Method" (2013). Scopus Export 2010-2014. 7467.
https://stars.library.ucf.edu/scopus2010/7467