Title
Nonlinear Refraction Measurements Of Thin Films By The Dualarm Z-Scan Method
Abstract
We report nonlinear-refractive indices of ZnO films on relatively thick substrates using the dual-arm Z-scan method to remove the substrate signals and obtain values agreeing with bulk ZnO, thus verifying the sensitivity of the technique. © OSA 2013.
Publication Date
1-1-2013
Publication Title
Optics InfoBase Conference Papers
Number of Pages
-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/nlo.2013.ntu1b.4
Copyright Status
Unknown
Socpus ID
85065588496 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85065588496
STARS Citation
Ensley, Trenton R.; Hu, Honghua; Ernst, Alfred R.; Fuentes-Hernandez, Canek; and Dindar, Amir, "Nonlinear Refraction Measurements Of Thin Films By The Dualarm Z-Scan Method" (2013). Scopus Export 2010-2014. 7478.
https://stars.library.ucf.edu/scopus2010/7478