Title

A Portable High-Resolution Surface Measurement Device

Keywords

Aerospace engineering; ergonomics; optical sensors; sensor systems

Abstract

A high-resolution portable surface measurement device has been demonstrated to provide micrometer-resolution topographical plots. This device was specifically developed to allow in situ measurements of defects on the Space Shuttle orbiter windows but is versatile enough to be used on a wide variety of surfaces. This paper discusses the choice of an optical sensor and then the decisions required to convert a laboratory bench optical measurement device into an ergonomic portable system. The necessary tradeoffs between performance and portability are presented along with a description of the device developed to measure orbiter window defects. © 2012 IEEE.

Publication Date

1-1-2013

Publication Title

IEEE Transactions on Instrumentation and Measurement

Volume

62

Issue

1

Number of Pages

205-209

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/TIM.2012.2212511

Socpus ID

84871032440 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84871032440

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