Title

Statistical Analysis Of Degradation Modes And Mechanisms In Various Thin-Film Photovoltaic Module Technologies

Keywords

Photovoltaics; Reliability; Thin-film Solar Cells

Abstract

PV arrays of various thin film modules technologies such as CIGS, rigid single-junction amorphous Silicon (glass-to-glass package) and flexible triple-junction amorphous Silicon have been deployed for over 10 years in hot and humid climate at Florida Solar Energy Center. The performance of selected modules from each array was characterized using visual inspection, dark I-V, flasher I-V, electroluminescence and infrared imaging techniques. Performance was evaluated to determine which, if any, degradation mechanisms are a concern for the long-term reliability of this technology.

Publication Date

1-1-2014

Publication Title

Proceedings of SPIE - The International Society for Optical Engineering

Volume

9179

Number of Pages

-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1117/12.2060727

Socpus ID

84922672081 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84922672081

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