Electroluminescence Based Metrics To Assess The Impact Of Cracks On Photovoltaic Module Performance

Keywords

cell cracking; electroluminescence; mechanical durability; module reliability

Abstract

Solar cell cracking is a potential reliability concern that may affect the long-term performance of modules that experience mechanical stress in the field. We present a methodology that utilizes EL images to predict power loss due to cell cracking. We explored pixel intensity histogram normalization methods to generalize this approach to a wide range of measurement conditions. The final optimized EL metric exhibits a strong correlation with power loss for a range of module technologies where a 1% increase in the dark area due to cracks results in a 3% loss in performance. This approach enables field EL mapping to translate to module P max mapping across a system.

Publication Date

11-26-2018

Publication Title

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

Number of Pages

455-458

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2018.8547636

Socpus ID

85059906362 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85059906362

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