Degradation Analysis Of Pv Modules After Long-Term Exposure In Florida

Keywords

durability; electroluminescence; module performance; reliability

Abstract

Field exposure is essential for evaluating the reliability and durability of PV modules. In this work we characterize three crystalline silicon PV systems that have been deployed in Florida. Detailed characterization of module performance was carried out to quantify degradation rates and identify root cause degradation mechanisms.

Publication Date

11-26-2018

Publication Title

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

Number of Pages

767-770

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC.2018.8547593

Socpus ID

85059880779 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85059880779

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