Title
Degradation Analysis Of Pv Modules After Long-Term Exposure In Florida
Keywords
durability; electroluminescence; module performance; reliability
Abstract
Field exposure is essential for evaluating the reliability and durability of PV modules. In this work we characterize three crystalline silicon PV systems that have been deployed in Florida. Detailed characterization of module performance was carried out to quantify degradation rates and identify root cause degradation mechanisms.
Publication Date
11-26-2018
Publication Title
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
Number of Pages
767-770
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/PVSC.2018.8547593
Copyright Status
Unknown
Socpus ID
85059880779 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85059880779
STARS Citation
Schneller, Eric J.; Shinde, Onkar; Dhere, Neelkanth G.; and Davis, Kristopher O., "Degradation Analysis Of Pv Modules After Long-Term Exposure In Florida" (2018). Scopus Export 2015-2019. 10550.
https://stars.library.ucf.edu/scopus2015/10550