Effect Of Dispersion On Metal-Insulator-Metal Infrared Absorption Resonances

Abstract

Metal-insulator-metal (MIM) resonant absorbers comprise a conducting ground plane, a thin dielectric, and thin separated metal top-surface structures. The dielectric SiO2 strongly absorbs near 9 m wavelength and has correspondingly strong long-wave-infrared (LWIR) dispersion for the refractive index. This dispersion results in multiple absorption resonances spanning the LWIR, which can enhance broad-band sensitivity for LWIR bolometers. Similar considerations apply to silicon nitride Si3N4. TiO2 and AlN have comparatively low dispersion and give simple single LWIR resonances. These dispersion-dependent features for infrared MIM devices are demonstrated by experiment, electrodynamic simulation, and an analytic model based on standing waves.

Publication Date

9-1-2018

Publication Title

MRS Communications

Volume

8

Issue

3

Number of Pages

830-834

Document Type

Article

Personal Identifier

scopus

DOI Link

https://doi.org/10.1557/mrc.2018.88

Socpus ID

85047131576 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85047131576

This document is currently not available here.

Share

COinS