In Situ Transmission Electron Microscopy: A Powerful Tool For The Characterization Of Carrier-Selective Contacts

Keywords

carrier selective contacts; in situ transmission electron microscopy; silicon; transition metal oxide

Abstract

The goal of this paper is to provide an overview of an in situ transmission electron microscopy (TEM) technique used to study the thermal stability of various transition metal oxide-based contacts used as carrier-selective contacts in silicon solar cells. In the present work, MoOx/Al and WOx/Al were investigated as hole-selective rear contacts using a combination of in situ TEM and transmission line measurements (TLM).

Publication Date

6-1-2019

Publication Title

Conference Record of the IEEE Photovoltaic Specialists Conference

Number of Pages

3074-3076

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1109/PVSC40753.2019.8980542

Socpus ID

85081544883 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85081544883

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