Title
In Situ Transmission Electron Microscopy: A Powerful Tool For The Characterization Of Carrier-Selective Contacts
Keywords
carrier selective contacts; in situ transmission electron microscopy; silicon; transition metal oxide
Abstract
The goal of this paper is to provide an overview of an in situ transmission electron microscopy (TEM) technique used to study the thermal stability of various transition metal oxide-based contacts used as carrier-selective contacts in silicon solar cells. In the present work, MoOx/Al and WOx/Al were investigated as hole-selective rear contacts using a combination of in situ TEM and transmission line measurements (TLM).
Publication Date
6-1-2019
Publication Title
Conference Record of the IEEE Photovoltaic Specialists Conference
Number of Pages
3074-3076
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1109/PVSC40753.2019.8980542
Copyright Status
Unknown
Socpus ID
85081544883 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85081544883
STARS Citation
Ali, Haider; Koul, Supriya; Gregory, Geoffrey; Bullock, James; and Javey, Ali, "In Situ Transmission Electron Microscopy: A Powerful Tool For The Characterization Of Carrier-Selective Contacts" (2019). Scopus Export 2015-2019. 10643.
https://stars.library.ucf.edu/scopus2015/10643