Beam Deflection Measurements Of Nondegenerate Nonlinear Refractive Indices In Direct-Gap Semiconductors

Keywords

Dispersion; II-VI semiconductor materials; Nonlinear optics; Probes; Semiconductor device measurement; Zinc oxide

Abstract

We use the beam-deflection method to measure nondegenerate nonlinear refractive indices of ZnO and ZnSe and show, in agreement with theory, extremely nondegenerate nonlinear refraction is significantly larger than in the degenerate or near-degenerate case.

Publication Date

8-10-2015

Publication Title

Conference on Lasers and Electro-Optics Europe - Technical Digest

Volume

2015-August

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

Socpus ID

84954042745 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84954042745

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