Title
Beam Deflection Measurements Of Nondegenerate Nonlinear Refractive Indices In Direct-Gap Semiconductors
Keywords
Dispersion; II-VI semiconductor materials; Nonlinear optics; Probes; Semiconductor device measurement; Zinc oxide
Abstract
We use the beam-deflection method to measure nondegenerate nonlinear refractive indices of ZnO and ZnSe and show, in agreement with theory, extremely nondegenerate nonlinear refraction is significantly larger than in the degenerate or near-degenerate case.
Publication Date
8-10-2015
Publication Title
Conference on Lasers and Electro-Optics Europe - Technical Digest
Volume
2015-August
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
Copyright Status
Unknown
Socpus ID
84954042745 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84954042745
STARS Citation
Zhao, Peng; Reichert, Matthew; Ensley, Trenton R.; Hagan, David J.; and Van Stryland, Eric W., "Beam Deflection Measurements Of Nondegenerate Nonlinear Refractive Indices In Direct-Gap Semiconductors" (2015). Scopus Export 2015-2019. 1547.
https://stars.library.ucf.edu/scopus2015/1547