Title
Beam Deflection Measurements Of Nondegenerate Nonlinear Refractive Indices In Direct-Gap Semiconductors
Abstract
We use the beam-deflection method to measure nondegenerate nonlinear refractive indices of ZnO and ZnSe and show, in agreement with theory, extremely nondegenerate nonlinear refraction is significantly larger than in the degenerate or near-degenerate case. © OSA 2015.
Publication Date
5-4-2015
Publication Title
CLEO: QELS - Fundamental Science, CLEO_QELS 2015
Number of Pages
1551p-
Document Type
Article; Proceedings Paper
Personal Identifier
scopus
DOI Link
https://doi.org/10.1364/CLEO_QELS.2015.FW3D.7
Copyright Status
Unknown
Socpus ID
84935087027 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/84935087027
STARS Citation
Zhao, Peng; Reichert, Matthew; Ensley, Trenton R.; Hagan, David J.; and Van Stryland, Eric W., "Beam Deflection Measurements Of Nondegenerate Nonlinear Refractive Indices In Direct-Gap Semiconductors" (2015). Scopus Export 2015-2019. 1820.
https://stars.library.ucf.edu/scopus2015/1820