Beam Deflection Measurements Of Nondegenerate Nonlinear Refractive Indices In Direct-Gap Semiconductors

Abstract

We use the beam-deflection method to measure nondegenerate nonlinear refractive indices of ZnO and ZnSe and show, in agreement with theory, extremely nondegenerate nonlinear refraction is significantly larger than in the degenerate or near-degenerate case. © OSA 2015.

Publication Date

5-4-2015

Publication Title

CLEO: QELS - Fundamental Science, CLEO_QELS 2015

Number of Pages

1551p-

Document Type

Article; Proceedings Paper

Personal Identifier

scopus

DOI Link

https://doi.org/10.1364/CLEO_QELS.2015.FW3D.7

Socpus ID

84935087027 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/84935087027

This document is currently not available here.

Share

COinS