Title
Power Amplifier Reliability
Abstract
This chapter talks about power amplifier reliability subjected to voltage stress and thermal effect. Both class AB and class E power amplfiiers are discussed. In addition, the class E power amplifier is fabricated using 0.18 micron CMOS process and experimental data of power amplifier performance before and after stress are presented.
Publication Date
1-1-2016
Publication Title
SpringerBriefs in Applied Sciences and Technology
Issue
9789811008825
Number of Pages
19-31
Document Type
Article; Book Chapter
Personal Identifier
scopus
DOI Link
https://doi.org/10.1007/978-981-10-0884-9_4
Copyright Status
Unknown
Socpus ID
85027700624 (Scopus)
Source API URL
https://api.elsevier.com/content/abstract/scopus_id/85027700624
STARS Citation
Yuan, Jiann Shiun, "Power Amplifier Reliability" (2016). Scopus Export 2015-2019. 3797.
https://stars.library.ucf.edu/scopus2015/3797