Power Amplifier Reliability

Creator

Jiann Shiun Yuan, University of Central Florida

Abstract

This chapter talks about power amplifier reliability subjected to voltage stress and thermal effect. Both class AB and class E power amplfiiers are discussed. In addition, the class E power amplifier is fabricated using 0.18 micron CMOS process and experimental data of power amplifier performance before and after stress are presented.

Publication Date

1-1-2016

Publication Title

SpringerBriefs in Applied Sciences and Technology

Issue

9789811008825

Number of Pages

19-31

Document Type

Article; Book Chapter

Personal Identifier

scopus

DOI Link

https://doi.org/10.1007/978-981-10-0884-9_4

Copyright Status

Unknown

Socpus ID

85027700624 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85027700624

STARS Citation

Yuan, Jiann Shiun, "Power Amplifier Reliability" (2016). Scopus Export 2015-2019. 3797.
https://stars.library.ucf.edu/scopus2015/3797