Voltage-Controlled Oscillator Reliability

Abstract

This chapter talks about the LC oscillator reliability subjected to electrical stress. Mixed-mode device and circuit simulation results as well as experimental data of voltage-controlled LC oscillators are presented.

Publication Date

1-1-2016

Publication Title

SpringerBriefs in Applied Sciences and Technology

Issue

9789811008825

Number of Pages

33-48

Document Type

Article; Book Chapter

Personal Identifier

scopus

DOI Link

https://doi.org/10.1007/978-981-10-0884-9_5

Socpus ID

85027692808 (Scopus)

Source API URL

https://api.elsevier.com/content/abstract/scopus_id/85027692808

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